Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
نویسندگان
چکیده
منابع مشابه
Narrow-line light emission from porous silicon multilayers and microcavities
Porous silicon multilayers and microcavities, prepared by the pulsed electrochemical etching method, exhibit a variety of reflectivity and photoluminescence spectra. A comparison of the measured results with those calculated based on the transfer matrix method and quantum-box model reveals that the variation of the spectra can be attributed to the change in wavelength position of the stop-band ...
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ژورنال
عنوان ژورنال: MRS Proceedings
سال: 1999
ISSN: 0272-9172,1946-4274
DOI: 10.1557/proc-588-155